1. The market covered the gap on Wednesday and supported at 3400 points. The rest of this week fluctuated upward. After the market walked out of the day trip, the irrational rise today, including the differences after the high opening and the fall, was digested in the remaining days, and the index rose above 3500 points in the later period.Judging from the current trend, Mr. Biao predicted that the large probability of the market is evolving in the first trend. If the gap is not covered, it is better, indicating that the strong market rally can further open up the upside, cover the gap, and pay attention to the support at 3400 points.However, the index itself belongs to the upward trend of shock. After the excessive rise increases the selling, although the short-term market has fallen back, it is difficult to change the upward pattern of shock.
The high opening and low going of the index are nothing more than the T+1 trading mechanism, quantitative funds, poor short-term market trends and other reasons, resulting in a high probability of the stock market opening after news stimulation and low going due to emotional influence.In addition, today's market, if we take a step back, will cover the gap on Wednesday, and it will still be difficult to have an impact on this round of gains.It shows that the higher the market is, the higher the probability of the index going high and low is.
Has the market ended this round of rise?Happily, after the close, it stabilized at least above 3,400 points. Although the midday index fell further, individual stocks still rose by more than 2,800 points, with 115 daily limit stocks. At least not yet after the high opening and falling back, the market's general decline came. The turnover of Shanghai and Shenzhen stock markets is also 2 trillion yuan, and the volume exceeds 500 billion yuan.Brother Biao's idea is that the current market does not have the characteristics of ending the rally. Although the A50 futures index fell more than 3%, the intraday index of A shares did not turn green.